CRYSTALLOGRAPHY OF MODULAR MATERIALS
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TextOriginal language: English Publication details: NEW YOURK ; NEW YOURK OXFORD UNIVERSITY PRESS 2008Description: viii, 372Online resources: http://krc.immt.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=9994
Book
| Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|
| CSIR-IMMT | 548.73/FER (Browse shelf (Opens below)) | Available | 13180 |
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| 548.73/DAV Structure determination from powder diffraction data / | 548.73/DIN Powder diffraction : | 548.73/DRI X-ray diffraction by disordered lamellar structures : | 548.73/FER CRYSTALLOGRAPHY OF MODULAR MATERIALS | 548.73/GLA Small angle x-ray scattering / | 548.73/HAU Crystal structure determination; | 548.73/KLO Total-reflection X-ray fluorescence analysis / |
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