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SCANNING PROBE MICROSCOPY: ATOMIC SCALE ENGINEERING BY FORCES AND CURRENTS

By: FOSTER, ADAM.SMaterial type: Text

TextOriginal language: English Publication details: NEW YORK ; NEW YORK SPINGER 2006Description: xiii, 281pISBN: 100387400907Online resources: http://krc.immt.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=9911

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Holdings
Current library	Call number	Status	Date due	Barcode
CSIR-IMMT	5537.533.35/FOS (Browse shelf (Opens below))	Available		13081

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