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X-ray diffraction at elevated temperatures : a method for in situ process analysis / D.D.L. Chung ... [et al.].

Contributor(s): Chung, Deborah D. LMaterial type: Text

TextPublication details: New York : VCH, c1993Description: viii, 268 p. : ill. ; 24 cmISBN: 0895737450; 3527278427Subject(s): X-rays -- Diffraction | X-rays -- Industrial applicationsDDC classification: 548/.83 LOC classification: QC482.D5 | X74 1993

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Current library	Call number	Status	Date due	Barcode
CSIR-IMMT	548.73/CHO (Browse shelf (Opens below))	Available		9496

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Previous	548.73/AME POWDER DIFFRACTION FILE : INORGANIC VOLUME SETS 1-5	548.73/BUE THE PRECESSION METHOD IN X-RAY CRYSTALLOGRAPHY	548.73/CHA MULTIPLE DIFFRACTION OF X-RAY IN CRYSTALS	548.73/CHO X-ray diffraction at elevated temperatures :	548.73/DAV Structure determination from powder diffraction data /	548.73/DIN Powder diffraction :	548.73/DRI X-ray diffraction by disordered lamellar structures :	Next

Includes bibliographical references and index.

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