X-ray diffraction by disordered lamellar structures : theory and applications to microdivided silicates and carbons / Victor A. Drits, Cyril Tchoubar with the collaboration of G. Besson ... [et al.] ; [translated from the French by R. Setton].
Material type:
TextLanguage: English Original language: French Publication details: Berlin ; New York : Springer-Verlag, c1990Description: xvii, 371 p. : ill. ; 24 cmISBN: 3540512225 (Berlin : acidfree paper); 0387512225 (New York : acidfree paper) :Subject(s): X-ray crystallography | X-rays -- DiffractionDDC classification: 548/.83 LOC classification: QD945 | .D75 1990
Book
| Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|
| CSIR-IMMT | 548.73/DRI (Browse shelf (Opens below)) | Available | 9735 |
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| 548.73/CHO X-ray diffraction at elevated temperatures : | 548.73/DAV Structure determination from powder diffraction data / | 548.73/DIN Powder diffraction : | 548.73/DRI X-ray diffraction by disordered lamellar structures : | 548.73/FER CRYSTALLOGRAPHY OF MODULAR MATERIALS | 548.73/GLA Small angle x-ray scattering / | 548.73/HAU Crystal structure determination; |
Includes bibliographical references and indexes.
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