Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; foreword by T. E. Everhart.
Material type:

Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|
CSIR-IMMT | 620.186.187 / GOL (Browse shelf (Opens below)) | Available | 5922 |
Includes bibliographical references and index.
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