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| 003 | IMMT | ||
| 005 | 20160202155400.0 | ||
| 008 | 151004s1970 xx 000 0 eng d | ||
| 040 |
_aIMMT _beng _cIMMT |
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| 041 | _heng | ||
| 080 | _a621.382 KAN | ||
| 100 | _aKANE, PHILIP F | ||
| 245 | _aCHARACTERIZATION OF SEMICONDUCTOR MATERIALS | ||
| 260 |
_bMC GRAW-HILL _aNEWYORK _c1970 |
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| 260 | _bNEWYORK | ||
| 300 | _a351 p | ||
| 365 | _c | ||
| 942 |
_2DDC _cBK |
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| 999 |
_c3529 _d3529 |
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| 856 |
_uhttp://krc.immt.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=3529 _yhttp://krc.immt.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=3529 |
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