| 000 | 00914cam a2200265 i 4500 | ||
|---|---|---|---|
| 001 | 4570774 | ||
| 003 | I11T | ||
| 005 | 20161117115537.0 | ||
| 008 | 750102s1975 nyua b 001 0 eng | ||
| 010 | _a 74034162 | ||
| 020 | _a0306308207 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aQH212.S3 _bG64 |
| 082 | 0 | 0 | _a502/.8 |
| 100 | 1 |
_aGoldstein, Joseph, _d1939- |
|
| 245 | 1 | 0 |
_aPractical scanning electron microscopy : _belectron and ion microprobe analysis / _cedited by Joseph I. Goldstein and Harvey Yakowitz ; foreword by T. E. Everhart. |
| 260 |
_aNew York : _bPlenum Press, _c[1975] |
||
| 300 |
_axviii, 582 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aScanning electron microscopy. | |
| 650 | 0 | _aMicroprobe analysis. | |
| 700 | 1 |
_aYakowitz, Harvey, _d1939- _ejoint author. |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2udc _cBK |
||
| 999 |
_c18841 _d18841 |
||